• DocumentCode
    979565
  • Title

    Improved flagging for pattern classifying diagnostic systems

  • Author

    Chin, Hsinyung ; Danai, Kourosh

  • Author_Institution
    Dept. of Mech. Eng., Massachusetts Univ., Amherst, MA, USA
  • Volume
    23
  • Issue
    4
  • fYear
    1993
  • Firstpage
    1101
  • Lastpage
    1107
  • Abstract
    Fault detection and isolation (diagnosis) is based on residual generation and residual analysis. The model-based approach flags the residuals through thresholding, to isolate the effect of faults from noise, and performs diagnosis by mapping the residuals to a residual space with prespecified fault signatures. The main problem with this approach is that thresholds are not always able to differentiate between the effect of faults and noise, so this approach suffers from false alarms, undetected faults, and misdiagnosis. As an alternative to prespecified fault signatures and to cope with their variability, the use of pattern classification techniques has been proposed. However, since tile fault signatures established by these classifiers are formed irrespective of diagnosability, this approach is also prone to misdiagnosis. In this paper the authors demonstrate the application of a flagging unit that enhances the quality of fault signatures. This unit, which relies on a training set to tune its parameters, is shown to improve detection, reduce the number of false alarms and enhance diagnostics
  • Keywords
    fault location; nonparametric statistics; pattern recognition; fault signatures; flagging; misdiagnosis; model-based approach; pattern classification; pattern classifying diagnostic systems; residual analysis; residual generation; thresholding; training set; Costs; Fault detection; Fault diagnosis; Inspection; Machinery; Maintenance; Mathematical model; Monitoring; Pattern classification; Pollution measurement;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9472
  • Type

    jour

  • DOI
    10.1109/21.247891
  • Filename
    247891