Title :
Microwave properties of thin film NbN SQUIDs with granular weak lines
Author :
Steiner, Richard L. ; Flora, Allen P. ; Deaver, Bascom S., Jr. ; Cukauskas, Edward J.
Author_Institution :
University of Virginia, Charlottesville, VA
fDate :
1/1/1981 12:00:00 AM
Abstract :
A series of NbN thin film SQUIDs with transition temperatures ranging from 5 K to ∼14 K are being characterized by microwave measurements at 9.6 GHz. The data are being used to determine the critical current, resistance, and energy sensitivity of each device, to identify features that may be related particularly to the granular nature of the weak links, and to study systematically the variations of the SQUID response with temperature. The devices are nominally 1 μm long, 10 nm thick and from 1 μm to ∼50 μm wide and are fabricated on 1 mm-diameter quartz rods. All have previously been well characterized as SQUIDs at 23 MHz. Detailed results are presented for the first five devices studied.
Keywords :
Electromagnetic radiation effects; Josephson devices; Critical current; Hysteresis; Josephson junctions; Microwave integrated circuits; SQUIDs; Tail; Temperature dependence; Temperature distribution; Transistors; Virtual reality;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1061058
