DocumentCode
979816
Title
Three-dimensional IC trends
Author
Akasaka, Yoichi
Author_Institution
Mitsubishi Electric Corporation, Itami, Japan
Volume
74
Issue
12
fYear
1986
Firstpage
1703
Lastpage
1714
Abstract
VLSI will be reaching to the limit of minimization in the 1990s, and after that, further increase of packing density or functions might depend on the vertical integration technology. Three-dimensional (3-D) integration is expected to provide several advantages, such as 1) parallel processing, 2) high-speed operation, 3) high packing density, and 4) multifunctional operation. Basic technologies of 3-D IC are to fabricate SOI layers and to stack them monolithically. Crystallinity of the recrystallized layer in SOI has increasingly become better, and very recently crystalaxis controlled, defect-free single-crystal area has been obtained in chip size level by laser recystallization technology. Some basic functional medels showing the concept or image of a future 3-D IC were fabricated in two or three stacked active layers. Some other proposals of subsystems in the application of 3-D structure, and the technical issues for realizing practical 3-D IC, i.e., the technology for fabricating high-quality SOI crystal on complicated surface topology, crosstalk of the signals between the stacked layers, total power consumption and cooling of the chip, will also be discussed in this paper.
Keywords
Crosstalk; Crystallization; Energy consumption; Optical control; Parallel processing; Proposals; Size control; Three-dimensional integrated circuits; Topology; Very large scale integration;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1986.13686
Filename
1457954
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