DocumentCode :
979816
Title :
Three-dimensional IC trends
Author :
Akasaka, Yoichi
Author_Institution :
Mitsubishi Electric Corporation, Itami, Japan
Volume :
74
Issue :
12
fYear :
1986
Firstpage :
1703
Lastpage :
1714
Abstract :
VLSI will be reaching to the limit of minimization in the 1990s, and after that, further increase of packing density or functions might depend on the vertical integration technology. Three-dimensional (3-D) integration is expected to provide several advantages, such as 1) parallel processing, 2) high-speed operation, 3) high packing density, and 4) multifunctional operation. Basic technologies of 3-D IC are to fabricate SOI layers and to stack them monolithically. Crystallinity of the recrystallized layer in SOI has increasingly become better, and very recently crystalaxis controlled, defect-free single-crystal area has been obtained in chip size level by laser recystallization technology. Some basic functional medels showing the concept or image of a future 3-D IC were fabricated in two or three stacked active layers. Some other proposals of subsystems in the application of 3-D structure, and the technical issues for realizing practical 3-D IC, i.e., the technology for fabricating high-quality SOI crystal on complicated surface topology, crosstalk of the signals between the stacked layers, total power consumption and cooling of the chip, will also be discussed in this paper.
Keywords :
Crosstalk; Crystallization; Energy consumption; Optical control; Parallel processing; Proposals; Size control; Three-dimensional integrated circuits; Topology; Very large scale integration;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1986.13686
Filename :
1457954
Link To Document :
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