Title :
Comparison of current-switched logic gates for high-speed communications applications
Author :
Sharratt, A.A. ; Ward, S.
Author_Institution :
Dept. of Electron. Eng., Polytech., Huddersfield, UK
fDate :
2/1/1990 12:00:00 AM
Abstract :
Emitter-coupled current-switched logic circuits are compared for high-speed communications applications on the basis of delay versus power dissipation for a fixed noise margin. Standard 2.5-μm and oxide-isolated 1.5-μm fabrication processes are considered. Variable-threshold logic offers the lowest delays, but at the expense of increased power dissipation
Keywords :
bipolar integrated circuits; circuit analysis computing; delays; emitter-coupled logic; integrated logic circuits; logic gates; 1.5 micron; 2.5 micron; ECL; HSPICE; bipolar IC; current-switched logic gates; delay; digital simulation; emitter coupled logic circuits; fixed noise margin; high-speed communications applications; oxide isolated fabrication process; power dissipation; standard fabrication process; variable threshold logic; Circuit noise; Delay; Fabrication; Feedback circuits; Logic circuits; Logic gates; Negative feedback; Power dissipation; Switches; Telecommunications;
Journal_Title :
Solid-State Circuits, IEEE Journal of
