DocumentCode :
979834
Title :
Double-slot antennas on extended hemispherical and elliptical silicon dielectric lenses
Author :
Filipovic, Daniel F. ; Gearhart, Steven S. ; Rebeiz, Gabriel M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
41
Issue :
10
fYear :
1993
fDate :
10/1/1993 12:00:00 AM
Firstpage :
1738
Lastpage :
1749
Abstract :
Far-field patterns and Gaussian-beam coupling efficiencies are investigated for a double-slot antenna placed on hemispherical lenses with varying extension lengths. The radiation patterns of a double-slot antenna on a silicon dielectric lens are computed using ray-tracing inside the dielectric lens and electric and magnetic field integration on the spherical dielectric surface. The measured radiation patterns at 246 GHz and Gaussian-beam coupling efficiencies show good agreement with theory. The theoretical results are presented in terms of extension-length/radius and radius/λ, and therefore result in universal design curves for silicon lenses of different diameters and at different frequencies. The theoretical and experimental results indicate that for single units, there exists a wide range of extension lengths which result in high Gaussian-coupling efficiencies (50-60%) to moderately high f ´s. These Gaussian-coupling efficiencies can be increased to 80-90°% with the use of a λm/4 matching-cap layer. For imaging array applications with high packing densities, an extension-length/radius of 0.38 to 0.39 (depending on frequency) will result in peak directivity and a corresponding Gaussian-coupling efficiency 15-20% lower than for single units
Keywords :
antenna radiation patterns; dielectric devices; lens antennas; silicon; slot antennas; 246 GHz; 50 to 90 percent; EHF; Gaussian-beam coupling efficiencies; MM-wave type; Si dielectric lenses; double-slot antennas; electric field integration; elliptical dielectric lenses; extension lengths; far-field patterns; hemispherical dielectric lenses; imaging array applications; magnetic field integration; radiation patterns; ray-tracing; universal design curves; Antenna measurements; Antenna radiation patterns; Dielectric measurements; Frequency; Gaussian processes; Lenses; Magnetic field measurement; Optical design; Ray tracing; Silicon;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.247919
Filename :
247919
Link To Document :
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