DocumentCode :
980141
Title :
High-mobility Ga0.47In0.53As thin epitaxial layers grown by MBE, very closely lattice-matched to InP
Author :
Massies, J. ; Rochette, J. ; Delescluse, P. ; Etienne, P. ; Chevrier, J. ; Linh, Nuyen T.
Author_Institution :
Thomson-CSF, Central Research Laboratory, Orsay, France
Volume :
18
Issue :
18
fYear :
1982
Firstpage :
758
Lastpage :
760
Abstract :
Thin epitaxial layers (< 1.5 ¿m) of Ga0.47In0.53As were grown by molecular beam epitaxy, very closely lattice-matched to InP, despite a nonrotating substrate holder. Hall mobilities were measured as a function of temperature in the dark and on illumination. At low temperature, the peak mobility of undoped layers lies between 35000 and 40000 cm2V¿1s¿1 in the dark and increases up to 45000 cm2V¿1s¿1 when measured in the light. Preliminary results obtained on slightly Sn-doped layers are also reported.
Keywords :
Hall effect; III-V semiconductors; carrier mobility; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor epitaxial layers; Ga0.47In0.53As thin epitaxial layers; Hall mobility; III-V semiconductors; InP; MBE; Sn-doped layers; illumination; lattice matching;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19820513
Filename :
4246774
Link To Document :
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