DocumentCode :
980149
Title :
Interdigitated pn junction device with novel capacitance/voltage characteristic, ultralow capacitance and low punch-through voltage
Author :
Capasso, F. ; Logan, R.A. ; Tsang, W.T.
Author_Institution :
Bell Laboratories, Murray Hill, USA
Volume :
18
Issue :
18
fYear :
1982
Firstpage :
760
Lastpage :
761
Abstract :
The first demonstration of the recently disclosed channelling diode is reported. The structure combines important and unique features which can be used for a large variety of applications. The diode exhibits a novel capacitance/voltage characteristic; large capacitance variations (1 pF) have been achieved over a small voltage range. Operated as a PIN diode the device has an ultralow capacitance (0.05 pF) and a low punch-through voltage (2¿3 V). This small capacitance is largely independent of the detector area and of the doping of the layers. These features are important for ultralow noise PINFET receiver applications.
Keywords :
avalanche photodiodes; p-n junctions; PIN diode; PINFET receiver; avalanche photodiode; capacitance/voltage characteristic; channelling diode; interdigitated p-n junction device; punch-through voltage;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19820514
Filename :
4246775
Link To Document :
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