A scaling technique for partial element equivalent circuit analysis using SPICE

Author

Jayabalan, Jayasanker ; Leong, Ooi Ban ; Seng, Leong Mook ; Iyer, Mahadevan K.

Author_Institution

Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore

Volume

14

Issue

5

fYear

2004

fDate

5/1/2004 12:00:00 AM

Firstpage

216

Lastpage

218

Abstract

A scaling technique for partial element equivalent circuit (PEEC) analysis using SPICE is introduced in this letter. The perturbation series based scaling is applied to the component values extracted by the standard PEEC method to get up to an order of magnitude improvement in relative accuracy of scattering parameters with SPICE simulation. The effectiveness of the technique is verified by using the numerical example of a stripline structure and comparing the results with that of the method of moments (IE3D).

Keywords

SPICE; equivalent circuits; method of moments; perturbation theory; strip lines; waveguide theory; Baker-Campbell-Hausdorff-Dynkin series; PEEC method; SPICE simulation; method of moments; parasitic extraction; partial element equivalent circuit analysis; perturbation series based scaling; scaling algorithm; scaling technique; scattering parameters; stripline structure; Circuit analysis; Circuit simulation; Dielectric losses; Equivalent circuits; Frequency; Jacobian matrices; SPICE; Scattering parameters; Stripline; Transmission line matrix methods; Baker–Campbell–Hausdorff–Dynkin series; SPICE; parasitic extraction; partial element equivalent circuit; scaling algorithm;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2004.827840

Filename

1296665