• DocumentCode
    980171
  • Title

    Photodisplacement microscopy using a semiconductor laser

  • Author

    Martin, Yves ; Ash, E.A.

  • Author_Institution
    University College London, Department of Electrical & Electronic Engineering, London, UK
  • Volume
    18
  • Issue
    18
  • fYear
    1982
  • Firstpage
    763
  • Lastpage
    764
  • Abstract
    A photodisplacement microscope has been realised, using a modulated semiconductor laser as the heating source and a phase sensitive HeNe laser probe for detection. Experimental results indicate that the instrument can have a wide range of applicability, including problems in nondestructive examination.
  • Keywords
    acoustic microscopes; nondestructive testing; photoacoustic effect; semiconductor junction lasers; heating source; modulated semiconductor laser; nondestructive testing; phase sensitive HeNe laser probe; photodisplacement microscope;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820516
  • Filename
    4246777
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=980171