Title :
The influence of self-coupling in Josephson junctions on the lower threshold of the I-V characteristic
Author :
Erne, S.N. ; Lubbig, H.
Author_Institution :
Institut Berlin, Berlin, Germany
fDate :
1/1/1981 12:00:00 AM
Abstract :
A study of a dc-current biased retarded tunnel junction is presented. The influence of self-coupling on the hysteresis-characteristic is reported for vanishingly small temperature.
Keywords :
Josephson devices; Capacitance; Critical current; Current density; Differential equations; Hysteresis; Josephson junctions; Kernel; Temperature; Threshold voltage; Zero voltage switching;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1061132
