DocumentCode :
980451
Title :
Exhaustive simulation need not require an exponential number of tests
Author :
Brand, Daniel
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
12
Issue :
11
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
1635
Lastpage :
1641
Abstract :
Simulation is today the most common form of verification. One disadvantage of simulation is the excessive number of tests needed for complete coverage. However, as will be shown, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise
Keywords :
circuit analysis computing; digital simulation; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Circuit testing; Computational modeling; Design automation; Hardware; Notice of Violation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.248074
Filename :
248074
Link To Document :
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