• DocumentCode
    980585
  • Title

    3-D low-loss coplanar waveguide transmission lines in multilayer MMICs

  • Author

    Van Tuyen Vo ; Krishnamurthy, Lokesh ; Sun, Qing ; Rezazadeh, Ali A.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Manchester Univ.
  • Volume
    54
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    2864
  • Lastpage
    2871
  • Abstract
    Newly developed transmission-line structures using the great flexibility of three-dimensional multilayer technology have been designed and fabricated. In this paper, we demonstrate that monolithic microwave integrated circuit (MMIC) coplanar waveguide transmission lines with a wide range of characteristic impedances can easily be designed using the multilayer technique. Furthermore, this implementation can avoid the well-known current crowding effects on the conductor edges minimizing dissipation loss. The system of three layers of metals and two layers of sandwich polyimide as dielectrics was employed. The fabricated transmission lines have been characterized providing a wide range of impedances from 10 to 70 Omega. In addition, the effects of unintentional horizontal and vertical coupling in multilayer MMICs have been investigated. The results indicated that an optimum separation of 75 mum is necessary for negligible coupling (~-30 dB)
  • Keywords
    MMIC; coplanar transmission lines; coplanar waveguides; 3D low-loss coplanar waveguide transmission lines; 3D multilayer technology; conductor edges; current crowding effects; dissipation loss; monolithic microwave integrated circuit; multilayer MMIC; Coplanar transmission lines; Coplanar waveguides; Couplings; Distributed parameter circuits; Impedance; Integrated circuit technology; MMICs; Microwave theory and techniques; Nonhomogeneous media; Transmission lines; Coplanar waveguide (CPW); coupling; monolithic microwave integrated circuits (MMICs); transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2006.875458
  • Filename
    1643627