Title :
Model of inhomogeneous building facade for ray tracing method
Author :
Kwon, Susanna ; Koh, I.-S. ; Moon, H.-W. ; Lim, J.-W. ; Yoon, Young Joong
Author_Institution :
Microwave & Antenna Lab., Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
Abstract :
A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.
Keywords :
computational complexity; electromagnetic wave scattering; ray tracing; reflection; computational complexity; inhomogeneous building facade; ray tracing method; reflection coefficient; scattering effect;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20081651
