Title :
Measurement of noise source impedance of SMPS using a two probes approach
Author :
See, Kye Yak ; Deng, Junhong
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fDate :
5/1/2004 12:00:00 AM
Abstract :
A novel approach to determine common-mode (CM) and differential-mode (DM) noise source impedances of a low-power switched mode power supply (SMPS) has been developed using a two current probes approach. The proposed approach allows measurement of noise source impedance of a SMPS without interrupting its normal operation. With proper setup calibration, the proposed approach can derive an equivalent circuit model, consisting of resistive and reactive components, to represent the noise source impedance with reasonable accuracy. Once the equivalent circuit model of the noise source impedance is obtained through the measurement, the most effective filter configuration and suitable component values for the built-in power line electromagnetic interference (EMI) filter of the SMPS could be designed with ease.
Keywords :
electric impedance measurement; electric noise measurement; electromagnetic interference; equivalent circuits; filters; switched mode power supplies; EMI filter; SMPS; common-mode; differential-mode; equivalent circuit model; noise source impedance measurement; power line electromagnetic interference; reactive component; resistive component; switched mode power supply; two current probes approach; Calibration; Circuit noise; Delta modulation; Electromagnetic interference; Equivalent circuits; Filters; Impedance measurement; Noise measurement; Probes; Switched-mode power supply; CM; Common-mode; DM; EMI filter; SMPS; differential-mode; switched mode power supply;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2004.826520