Title :
Fault coverage of pattern-sensitive fault-detection algorithms for semiconductor memories
Author :
Sarma, Deva ; Papachristou, Christos A. ; Saifuddin, F.T.
Author_Institution :
University of Cincinnati, Department of Electrical & Computer Engineering, Cincinnati, USA
Abstract :
Experimental studies have been made on the fault coverage of pattern-sensitive fault-detection algorithms proposed for semiconductor memories. The experiment is carried out on a microprocessor-based system. A comparative study has been made based on the experimental results.
Keywords :
fault location; integrated circuit testing; integrated memory circuits; random-access storage; RAM; fault coverage; microprocessor-based system; pattern-sensitive fault-detection algorithms; semiconductor memories;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820653
