• DocumentCode
    981557
  • Title

    Fault coverage of pattern-sensitive fault-detection algorithms for semiconductor memories

  • Author

    Sarma, Deva ; Papachristou, Christos A. ; Saifuddin, F.T.

  • Author_Institution
    University of Cincinnati, Department of Electrical & Computer Engineering, Cincinnati, USA
  • Volume
    18
  • Issue
    22
  • fYear
    1982
  • Firstpage
    950
  • Lastpage
    951
  • Abstract
    Experimental studies have been made on the fault coverage of pattern-sensitive fault-detection algorithms proposed for semiconductor memories. The experiment is carried out on a microprocessor-based system. A comparative study has been made based on the experimental results.
  • Keywords
    fault location; integrated circuit testing; integrated memory circuits; random-access storage; RAM; fault coverage; microprocessor-based system; pattern-sensitive fault-detection algorithms; semiconductor memories;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820653
  • Filename
    4247000
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=981557