Title :
SAW attenuation measurement in the acoustic microscope
Author :
Smith, I.R. ; Wickramasinghe, H.K.
Author_Institution :
University College London, Department of Electronic & Electrical Engineering, London, UK
Abstract :
A direct method for measuring surface-acoustic-wave attenuation using the scanning acoustic microscope is presented. The use of an annular lens excludes the longitudinal wave component from a normal V(z) measurement, and so an interference-free measurement of surface-wave attenuation alone is possible. Simple corrections compensate for both absorption in the coupling fluid as well as variations in the critical angle.
Keywords :
acoustic microscopes; attenuation measurement; surface acoustic waves; ultrasonic absorption; SAW attenuation measurement; acoustic microscope; annular lens; interference-free measurement; surface-acoustic-wave;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820656
