• DocumentCode
    981591
  • Title

    SAW attenuation measurement in the acoustic microscope

  • Author

    Smith, I.R. ; Wickramasinghe, H.K.

  • Author_Institution
    University College London, Department of Electronic & Electrical Engineering, London, UK
  • Volume
    18
  • Issue
    22
  • fYear
    1982
  • Firstpage
    955
  • Lastpage
    956
  • Abstract
    A direct method for measuring surface-acoustic-wave attenuation using the scanning acoustic microscope is presented. The use of an annular lens excludes the longitudinal wave component from a normal V(z) measurement, and so an interference-free measurement of surface-wave attenuation alone is possible. Simple corrections compensate for both absorption in the coupling fluid as well as variations in the critical angle.
  • Keywords
    acoustic microscopes; attenuation measurement; surface acoustic waves; ultrasonic absorption; SAW attenuation measurement; acoustic microscope; annular lens; interference-free measurement; surface-acoustic-wave;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820656
  • Filename
    4247003