Title :
Digital signal processor for test and measurement environment
Author :
Kareem, Arif ; Saxe, Charles L. ; Etheridge, Eric ; McKinney, David
Author_Institution :
Tektronix Inc., Beaverton, OR, USA
Abstract :
This paper describes a high-performance digital signal processor, TriStar, developed for signal processing applications in test and measuring instruments. It executes typical signal processing tasks with very high throughput because of the concurrent operation of three units: instruction fetch unit, arithmetic unit, and address computation unit. A parallel architecture in addition to single-cycle operations allows the TriStar to run signal processing algorithms with an efficiency never before available to an instrument designer.
Keywords :
Arithmetic; Computer aided instruction; Concurrent computing; Digital signal processing; Digital signal processors; Instruments; Parallel architectures; Signal processing algorithms; Testing; Throughput;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1987.13869
