• DocumentCode
    981775
  • Title

    Dielectric constant of semi-insulating indium phosphide

  • Author

    Neidert, R.E. ; Binari, S.C. ; Weng, Tsu-Chien

  • Author_Institution
    Naval Research Laboratory, Washington, USA
  • Volume
    18
  • Issue
    23
  • fYear
    1982
  • Firstpage
    987
  • Lastpage
    988
  • Abstract
    Results are given on precision measurements of the relative dielectric constant of semi-insulating indium phosphide. It is concluded that the static value is within less than 0.5% of 12.55 based on a statistical average of a large number of measurements on several material samples.
  • Keywords
    III-V semiconductors; dielectric properties of solids; indium compounds; permittivity; relative dielectric constant; semiconductor; semiinsulating InP;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820675
  • Filename
    4247025
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=981775