Title :
Analysis and design optimization of electrooptic interferometric modulators for microphotonics applications
Author :
Chen, Ding-Yuan ; Phillips, Jamie D.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
6/1/2006 12:00:00 AM
Abstract :
Scaling the electrode layout (electrode gap, electrode length) down to microscale dimensions extends the application of electrooptic (EO) modulators to microphotonics. In this paper, design criteria are set up to minimize the switching voltage of microscale EO Mach-Zehnder interferometric modulators. Mach-Zehnder interferometric modulators under different directions of electric field with respect to the optic axis are analyzed. Three expressions of the intensity output characteristics are presented for various crystal classes and compared in terms of conditions of validity and design applications. The analysis in this paper suggests that the switching voltage is strongly related with the direction of the electric field relative to the optic axis. For the 4-mm BaTiO3 (r33=28 pm/V,r51=820 pm/V) Mach-Zehnder modulators, r51 is utilized when the electric field is applied normal to the optic axis. In this configuration, the thermal stability and polarization insensitivity improve but the extinction ratio becomes a function of the electrode length. The phase-retardation expression is useful to find a suitable modulator length and maximize the extinction ratio. Some of the discussions also apply to Fabry-Pe´rot interferometric modulators.
Keywords :
barium compounds; electro-optical modulation; electro-optical switches; electrodes; integrated optics; light interferometry; light polarisation; micro-optics; optical design techniques; thermal stability; BaTiO3; Mach-Zehnder modulators; design optimization; electrooptic modulators; extinction ratio; integrated optics; intensity output characteristics; interferometric modulators; microphotonics; phase retardation; Design optimization; Electrodes; Electrooptic modulators; Extinction ratio; Optical interferometry; Optical modulation; Optical polarization; Phase modulation; Thermal stability; Voltage; Integrated optics; interferometric modulators; linear electrooptic (EO) effect; modulation depth; optical sensors; polarization insensitivity; thermal stability;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2006.874603