• DocumentCode
    9823
  • Title

    3-D Packaging With Through-Silicon Via (TSV) for Electrical and Fluidic Interconnections

  • Author

    Khan, Noel ; Li Hong Yu ; Tan Siow Pin ; Soon Wee Ho ; Kripesh, V. ; Pinjala, D. ; Lau, John H. ; Toh Kok Chuan

  • Author_Institution
    Inst. of Microelectron., Agency for Sci., Technol. & Res., Singapore, Singapore
  • Volume
    3
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    221
  • Lastpage
    228
  • Abstract
    In this paper, a liquid cooling solution has been reported for 3-D package in package-on-package format. A high heat dissipating chip is mounted on a silicon carrier, which has copper through-silicon via (TSV) for electrical interconnection and hollow TSV for fluidic circulation. Heat transfer enhancement structures have been embedded in the chip carrier. Cooling liquid, de-ionized water is circulated through the chip carrier and heat from the chip is extracted. The fluidic channels are isolated from electrical traces using hermetic sealing. The research work has demonstrated liquid cooling solution for 100 W from one stack and total of 200 W from two stacks of the package. The fluidic interconnections and sealing techniques have been discussed.
  • Keywords
    cooling; copper; hermetic seals; integrated circuit interconnections; integrated circuit packaging; three-dimensional integrated circuits; 3D packaging; Cu; deionized water; electrical interconnection; fluidic circulation; fluidic interconnection; heat transfer enhancement; hermetic sealing; liquid cooling; package-on-package format; sealing technique; through silicon via; Heat transfer; Heating; Liquid cooling; Thermal resistance; Through-silicon vias; 3-D packaging; liquid cooling; micro-channel cooling;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2186297
  • Filename
    6410399