• DocumentCode
    982362
  • Title

    Near state-of-the-art power in p+-n-n+D-band IMPATT diode on a wafer with ramped n-n+interface

  • Author

    Singh, J.K. ; Gokgor, H.S. ; Howard, A.M. ; Myers, F.A.

  • Author_Institution
    CEERI, Pilani, Rajasthan, India
  • Volume
    75
  • Issue
    12
  • fYear
    1987
  • Firstpage
    1688
  • Lastpage
    1690
  • Abstract
    Fabrication of near state-of-the-art (P0= 110 mW, η = 4.85 percent p+-n-n+D band (f = 124 GHz) Si IMPATT diode on a wafer with ramped n-n+interface is described. Introduction of a critical annealing step, prior to p+diffusion, in the fabrication sequence of the diode has been found to yield the above results. Possible reasons for power and efficiency enhancement has been discussed.
  • Keywords
    Antenna measurements; Diodes; Electromagnetic scattering; Pollution measurement; Radar cross section; Radar scattering; Rotation measurement; Rough surfaces; Sensor phenomena and characterization; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1987.13937
  • Filename
    1458204