Title :
Simplified inverse Fourier transform technique to measure optical nonlinearity profiles using reference sample
Author :
Ozcan, A. ; Digonnet, M.J.F. ; Kino, G.S.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fDate :
4/29/2004 12:00:00 AM
Abstract :
A new Maker-fringe technique based on the use of a known reference sample to measure the second-order nonlinearity profile of thin films is described and demonstrated experimentally. Advantages over previous techniques include greater accuracy, simpler measurement, and much simpler and faster data processing.
Keywords :
Fourier transform optics; nonlinear optics; optical variables measurement; thin films; Maker fringe technique; data processing; inverse Fourier transform technique; optical nonlinearity profiles; optical variables measurement; second order nonlinearity profile; thin films;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20040361
