DocumentCode
982478
Title
Simplified inverse Fourier transform technique to measure optical nonlinearity profiles using reference sample
Author
Ozcan, A. ; Digonnet, M.J.F. ; Kino, G.S.
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Volume
40
Issue
9
fYear
2004
fDate
4/29/2004 12:00:00 AM
Firstpage
551
Lastpage
552
Abstract
A new Maker-fringe technique based on the use of a known reference sample to measure the second-order nonlinearity profile of thin films is described and demonstrated experimentally. Advantages over previous techniques include greater accuracy, simpler measurement, and much simpler and faster data processing.
Keywords
Fourier transform optics; nonlinear optics; optical variables measurement; thin films; Maker fringe technique; data processing; inverse Fourier transform technique; optical nonlinearity profiles; optical variables measurement; second order nonlinearity profile; thin films;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20040361
Filename
1296986
Link To Document