DocumentCode :
982795
Title :
Determining and improving the fault tolerance of multilayer perceptrons in a pattern-recognition application
Author :
Emmerson, Martin D. ; Damper, Robert I.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
Volume :
4
Issue :
5
fYear :
1993
fDate :
9/1/1993 12:00:00 AM
Firstpage :
788
Lastpage :
793
Abstract :
We investigate empirically the performance under damage conditions of single- and multilayer perceptrons (MLP´s), with various numbers of hidden units, in a representative pattern-recognition task. While some degree of graceful degradation was observed, the single-layer perceptron was considerably less fault tolerant than any of the multilayer perceptrons, including one with fewer adjustable weights. Our initial hypothesis that fault tolerance would be significantly improved for multilayer nets with larger numbers of hidden units proved incorrect. Indeed, there appeared to be a liability to having excess hidden units. A simple technique (called augmentation) is described, which was successful in translating excess hidden units into improved fault tolerance. Finally, our results were supported by applying singular value decomposition (SVD) analysis to the MLP´s internal representations
Keywords :
backpropagation; fault tolerant computing; feedforward neural nets; pattern recognition; augmentation; backpropagation training; coin classification; fault tolerance; hidden units; internal representations; multilayer perceptrons; pattern recognition; singular value decomposition; Artificial neural networks; Degradation; Fault tolerance; Measurement; Multilayer perceptrons; Neural networks; Nonhomogeneous media; Parallel processing; Redundancy; Very large scale integration;
fLanguage :
English
Journal_Title :
Neural Networks, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9227
Type :
jour
DOI :
10.1109/72.248456
Filename :
248456
Link To Document :
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