DocumentCode :
982896
Title :
Cross-polarization measurements and their relation to target surface properties
Author :
Krishen, K. ; Koepsel, W.W. ; Durrani, S.H.
Author_Institution :
Kansas State Univ., Manhattan, KS, USA
Volume :
14
Issue :
5
fYear :
1966
fDate :
9/1/1966 12:00:00 AM
Firstpage :
629
Lastpage :
635
Abstract :
It has often been suggested in lunar studies that measurements of radar cross-polarization factor D should yield information on the target\´s surface roughness and dielectric properties. This paper describes an experimental effort to obtain quantitative data on \\langle D \\rangle , the average value of D , for randomly rough targets having Gaussian distribution of slopes. Bistatic X -band microwave measurements were conducted on targets with different dielectric constants but identical rough surfaces, and targets with same dielectrics but different statistics. The dependence of \\langle D \\rangle on various parameters is shown graphically, and extension to M.I.T. data of lunar crosspolarization is discussed.
Keywords :
Extraterrestrial measurements; Radar target recognition; Dielectric constant; Dielectric measurements; Extraterrestrial measurements; Moon; NASA; Polarization; Radar remote sensing; Radar scattering; Rough surfaces; Surface roughness;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.1966.1138759
Filename :
1138759
Link To Document :
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