DocumentCode :
983
Title :
A Scalable 0.128–1 Tb/s, 0.8–2.6 pJ/bit, 64-Lane Parallel I/O in 32-nm CMOS
Author :
Mansuri, Mozhgan ; Jaussi, J.E. ; Kennedy, J.T. ; Tzu-Chien Hsueh ; Shekhar, Shashi ; Balamurugan, Ganesh ; O´Mahony, Frank ; Roberts, Clive ; Mooney, Randy ; Casper, Bryan
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Volume :
48
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
3229
Lastpage :
3242
Abstract :
A scalable 64-lane chip-to-chip I/O, with per-lane data rate of 2-16 Gb/s is demonstrated in 32-nm low-power CMOS technology. At maximum aggregate bandwidth of 1.024 Tb/s across 50-cm channel length, the link consumes 2.7 W from a 1.08-V supply, corresponding to 2.6 pJ/bit. As bandwidth demand decreases, scaling the per-lane data rate to 4 Gb/s and power supply to 0.65 V provides 1/4 of the maximum bandwidth while consuming 0.2 W. Across a 1-m channel, the link operates at a maximum per-lane data rate of 16 Gb/s; thus, providing up to 1.024 Tb/s of aggregate bandwidth with 3.2 pJ/bit power efficiency from a 1.15-V supply. A length-matched dense interconnect topology allows clocking to be shared across multiple lanes to reduce area and power. Reconfigurable current/voltage mode transmitter driver and CMOS clocking enable a highly scalable power-efficient link. Optional low-dropout regulators provide >22-dB supply noise rejection at the package resonance frequency of 200 MHz. System-level optimization of duty-cycle and quadrature error correctors across the clock hierarchy provides optimized clock phase placement and, thus, enhances link performance and power. A lane failover mechanism provides design robustness to mitigate channel or circuit defects. The active circuitry occupies 1.3 mm2.
Keywords :
CMOS integrated circuits; driver circuits; error correction; integrated circuit interconnections; low-power electronics; network topology; power supply circuits; CMOS clocking; bandwidth demand; bit rate 0.28 Tbit/s; bit rate 2 Gbit/s to 16 Gbit/s; channel defect; channel length; chip-to-chip I/O; circuit defect; clock hierarchy; design robustness; duty-cycle; lane failover mechanism; length-matched dense interconnect topology; low-power CMOS technology; maximum aggregate bandwidth; optimized clock phase placement; optional low-dropout regulators; package resonance frequency; parallel I/O CMOS; per-lane data rate; power 2.7 W; power efficiency; power supply; power-efficient link; quadrature error correctors; reconfigurable current/voltage mode transmitter driver; size 32 nm; supply noise rejection; system-level optimization; voltage 1.08 V; Bandwidth; CMOS integrated circuits; Clocks; Connectors; Receivers; Transmitters; Voltage-controlled oscillators; CMOS clocking; high-speed I/O; link; low-area; low-power; scalable circuits;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2013.2279052
Filename :
6590037
Link To Document :
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