Title :
New laser-trimmed film resistor structures for very high stability requirements
Author :
Ramírez-Angulo ; Geiger, Randall L.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
The drift with time and/or temperature of laser-trimmed film resistors limits the effective accuracy attainable form laser-trimmed resistor circuits. This accuracy is dependent on the geometries of the film resistors and on the trimming process. Novel film resistor structures that practically and significantly improve the effective ultimate accuracy attainable with laser-trimmed film resistors over both time and temperature are proposed. The structures are evaluated using computer simulations. This technique is substantiated with an example that shows an improvement in resolution of 4 bits when compared to that attainable with conventional bar resistors
Keywords :
design engineering; laser beam machining; stability; thin film resistors; drift with temperature; drift with time; evaluated using computer simulations; film resistor geometry; film resistor structures; heat affected zone; high stability requirements; laser-trimmed film resistor structures; precision resistors; trimming process; Aging; Circuit stability; Conducting materials; Laser beam cutting; Laser stability; Laser theory; Optical materials; Resistors; Sheet materials; Temperature;
Journal_Title :
Electron Devices, IEEE Transactions on