• DocumentCode
    983256
  • Title

    New laser-trimmed film resistor structures for very high stability requirements

  • Author

    Ramírez-Angulo ; Geiger, Randall L.

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    35
  • Issue
    4
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    516
  • Lastpage
    518
  • Abstract
    The drift with time and/or temperature of laser-trimmed film resistors limits the effective accuracy attainable form laser-trimmed resistor circuits. This accuracy is dependent on the geometries of the film resistors and on the trimming process. Novel film resistor structures that practically and significantly improve the effective ultimate accuracy attainable with laser-trimmed film resistors over both time and temperature are proposed. The structures are evaluated using computer simulations. This technique is substantiated with an example that shows an improvement in resolution of 4 bits when compared to that attainable with conventional bar resistors
  • Keywords
    design engineering; laser beam machining; stability; thin film resistors; drift with temperature; drift with time; evaluated using computer simulations; film resistor geometry; film resistor structures; heat affected zone; high stability requirements; laser-trimmed film resistor structures; precision resistors; trimming process; Aging; Circuit stability; Conducting materials; Laser beam cutting; Laser stability; Laser theory; Optical materials; Resistors; Sheet materials; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.2487
  • Filename
    2487