Title :
A new discretization scheme for the semiconductor current continuity equations
Author :
Bürgler, Josef F. ; Bank, Randolph E. ; Fichtner, Wolfgang ; Smith, R. Kent
Author_Institution :
Inst. fur Integrierte Syst., ETH, Zurich, Switzerland
fDate :
5/1/1989 12:00:00 AM
Abstract :
A hybrid finite-element method to discretize the continuity equation in semiconductor device simulation is given. Within each element of a finite element discretization, the current is uniquely determined by nodal values of the density and the potential. The authors use the integrability condition for a system of partial differential equations to obtain the equations that determine the current within the element. They then satisfy the continuity in the current flow across interelement boundaries in a weak sense. They have found that the method works in any dimension and for (d-dimensional) simplexes as well as for quadrilaterals, bricks, prisms, and so on, although they have no proof that it will not break down in particular cases
Keywords :
digital simulation; finite element analysis; semiconductor device models; any dimension; bricks; discretization scheme; finite element discretization; hybrid finite-element method; integrability condition; multidimensional simplexes; nodal values; prisms; quadrilaterals; semiconductor current continuity equations; semiconductor device simulation; system of partial differential equations; Design automation; Differential equations; Finite difference methods; Finite element methods; Grid computing; Magnetic analysis; Nonlinear equations; Numerical simulation; Partial differential equations; Semiconductor devices;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on