Title :
Bound and quasibound state calculations for biased/unbiased semiconductor quantum heterostructures
Author :
Anemogiannis, Emmanuel ; Glytsis, Elias N. ; Gaylord, Thomas K.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
A complex transcendental equation valid for a wide range of electron energies for semiconductor quantum heterostructures under unbiased or biased conditions is derived. Its complex roots have as real parts the structure eigenenergy levels, and their imaginary parts are directly related to the lifetime of the corresponding eigenenergies. A numerical method is presented that is capable of extracting all these complex eigenenergies. The method is based on the argument principle theorem from complex number theory. Therefore, all the energy levels and lifetimes of bound and quasibound states can be determined. Energy levels and lifetimes can also be calculated in the presence of scattering events when these are modeled with an energy broadening imaginary potential. Extensive comparisons between this numerical method and other currently used techniques are included, proving the generality and the accuracy of this new method
Keywords :
eigenvalues and eigenfunctions; number theory; radiative lifetimes; semiconductor quantum wells; argument principle theorem; biased conditions; biased semiconductor quantum heterostructures; bound state calculations; complex number theory; complex transcendental equation; eigenenergy levels; eigenenergy lifetimes; electron energies; energy broadening imaginary potential; energy levels; energy lifetimes; imaginary parts; numerical method; quasibound state calculations; real parts; scattering events; unbiased conditions; unbiased semiconductor quantum heterostructures; Chemical lasers; Electrons; Energy states; Interference; Molecular beam epitaxial growth; Optical modulation; Optical scattering; Particle scattering; Schrodinger equation; Tunneling;
Journal_Title :
Quantum Electronics, IEEE Journal of