Title :
Surface Roughness and Light Scattering in a Small Effective Area Microstructured Fiber
Author :
Phan-Huy, Minh-Châu ; Moison, Jean-Marie ; Levenson, Juan Ariel ; Richard, Simon ; Mélin, Gilles ; Douay, Marc ; Quiquempois, Yves
Author_Institution :
Lab. of Photonics & Nanostruct., CNRS, Marcoussis
fDate :
6/1/2009 12:00:00 AM
Abstract :
We report here the combined study of air/silica surface roughness and light scattering in a microstructured optical fiber designed for non-linear operation. Side polishing of the fiber gave access to the surface of the holes, and allowed measurements of their roughness by atomic force microscopy. The observed roughness topography, not reported in such fibers until now, consists of a rather regular arrangement of shallow patterns with lateral size in the micron range and amplitude in the 10 nm range. By comparing measured angle-resolved scattering patterns to coupled-mode calculations, we show that roughness-induced scattering loss can be linked to both the roughness and the overlap of fundamental with radiative modes at the air/silica interfaces. The reduction of surface roughness amplitude down to the thermodynamic limit could permit to strongly decrease the threshold of Raman fiber lasers.
Keywords :
Raman lasers; atomic force microscopy; coupled mode analysis; fibre lasers; nonlinear optics; optical design techniques; optical fibre losses; optical fibre testing; silicon compounds; surface roughness; Raman fiber laser; SiO2; angle-resolved scattering pattern measurement; atomic force microscopy; coupled-mode calculation; light scattering; microstructured optical fiber design; radiative mode; roughness topography; roughness-induced scattering loss; size 10 nm; surface roughness; thermodynamic limit; Atomic force microscopy; Atomic measurements; Force measurement; Light scattering; Optical fibers; Photonic crystal fibers; Rough surfaces; Silicon compounds; Surface roughness; Surface topography; Atomic force microscopy; Raman laser; microstructured optical fiber; scattering loss; surface roughness;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2009.2020608