DocumentCode :
984352
Title :
Probabilistic Interval-Valued Computation: Toward a Practical Surrogate for Statistics Inside CAD Tools
Author :
Singhee, Amith ; Fang, Claire F. ; Ma, James D. ; Rutenbar, Rob A.
Author_Institution :
IBM T J. Watson Res. Center, Yorktown Heights, NY
Volume :
27
Issue :
12
fYear :
2008
Firstpage :
2317
Lastpage :
2330
Abstract :
Interval methods offer a general fine-grain strategy for modeling correlated range uncertainties in numerical algorithms. We present a new improved interval algebra that extends the classical affine form to a more rigorous statistical foundation. Range uncertainties now take the form of confidence intervals. In place of pessimistic interval bounds, we minimize the probability of numerical "escape"; this can tighten interval bounds by an order of magnitude while yielding 10-100 times speedups over Monte Carlo. The formulation relies on the following three critical ideas: liberating the affine model from the assumption of symmetric intervals; a unifying optimization formulation; and a concrete probabilistic model. We refer to these as probabilistic intervals for brevity. Our goal is to understand where we might use these as a surrogate for expensive explicit statistical computations. Results from sparse matrices and graph delay algorithms demonstrate the utility of the approach and the remaining challenges.
Keywords :
circuit CAD; sparse matrices; statistics; CAD tools; confidence intervals; graph delay algorithms; interval algebra; probabilistic interval-valued computation; sparse matrices; statistics; Added delay; Algebra; Arithmetic; Circuits; Error analysis; Monte Carlo methods; Statistical distributions; Statistics; Timing; Uncertainty; Algorithms; arithmetic; design automation; error analysis; interval arithmetic; simulation; statistics; variational methods;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.2006142
Filename :
4670058
Link To Document :
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