• DocumentCode
    984354
  • Title

    Transistor sizing for low power CMOS circuits

  • Author

    Borah, Manjit ; Owens, Robert Michael ; Irwin, Mary Jane

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    15
  • Issue
    6
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    665
  • Lastpage
    671
  • Abstract
    A direct approach to transistor sizing for minimizing the power consumption of a CMOS circuit under a delay constraint is presented. In contrast to the existing assumption that the power consumption of a static CMOS circuit is proportional to the active area of the circuit, it is shown that the power consumption is a convex function of the active area. Analytical formulation for the power dissipation of a circuit in terms of the transistor size is derived which includes both the capacitive and the short circuit power dissipation. SPICE circuit simulation results are presented to confirm the correctness of the analytical model. Based on the intuitions drawn from the analytical model, heuristics for initial transistor sizing on critical and noncritical paths for minimum power consumption are developed. Further, fast heuristics to perform transistor sizing in CMOS circuits for minimizing power consumption while meeting the given delay constraints are presented
  • Keywords
    CMOS logic circuits; SPICE; circuit analysis computing; delays; integrated circuit design; logic CAD; logic gates; SPICE; circuit simulation results; convex function; critical paths; delay constraint; heuristics; inverters; low power CMOS circuits; noncritical paths; power consumption; transistor sizing; Analytical models; Circuit simulation; Computer science; Delay; Delay effects; Energy consumption; Inverters; Low power electronics; Power dissipation; SPICE; Semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.503935
  • Filename
    503935