DocumentCode :
984417
Title :
Accelerated waveform methods for parallel transient simulation of semiconductor devices
Author :
Lumsdaine, Andrew ; Reichelt, Mark W. ; Squyres, Jeffrey M. ; White, K.
Author_Institution :
Lab. for Sci. Comput., Notre Dame Univ., IN, USA
Volume :
15
Issue :
7
fYear :
1996
fDate :
7/1/1996 12:00:00 AM
Firstpage :
716
Lastpage :
726
Abstract :
Simulating transients in semiconductor devices involves numerically solving the time-dependent drift-diffusion equations, usually in two or three space dimensions. Because of the computation cost of these simulations, methods that perform careful domain decomposition so as to exploit parallel processing have received much recent attention. In this paper, we describe using accelerated waveform relaxation (WR) to perform parallel device transient simulation using both clusters of workstations and the IBM SP-2. The accelerated WR algorithms are compared to pointwise direct and iterative methods, and it is shown that the accelerated WR method is competitive on a single processor. In addition, it is shown that with a domain decomposition chosen for rapid iterative method convergence rather than parallel efficiency, the pointwise methods parallelize poorly but the WR method achieves near linear speedup (with respect to the number of processors) on the IBM SP-2
Keywords :
digital simulation; electronic engineering computing; iterative methods; parallel algorithms; semiconductor device models; transient analysis; IBM SP-2; accelerated WR algorithms; accelerated waveform methods; domain decomposition; parallel transient simulation; semiconductor devices; time-dependent drift-diffusion equations; waveform relaxation; workstation clusters; Acceleration; Clustering algorithms; Computational efficiency; Computational modeling; Concurrent computing; Equations; Iterative methods; Parallel processing; Semiconductor devices; Workstations;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.503940
Filename :
503940
Link To Document :
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