DocumentCode :
984622
Title :
A framework for knowledge-based computer-integrated manufacturing
Author :
Pan, Jeff Y-C ; Tenenbaum, Jay M. ; Glicksman, Jay
Author_Institution :
Schlumberger ATE, San Jose, CA, USA
Volume :
2
Issue :
2
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
33
Lastpage :
46
Abstract :
A description is given of an evolving framework for applying knowledge systems in a manufacturing environment. This framework consists of a set of object-oriented tools for modeling key elements of the environment (including processes, equipment, facilities, and operational procedures) and a complementary set of application-specific shells that use the models to perform common manufacturing tasks such as monitoring, diagnosis, control, simulation, and scheduling. The testbed used is the semiconductor fabrication line at Stanford´s Center for Integrated Systems. The key concept is a symbolic model of the manufacturing environment that can be created and maintained by manufacturing personnel. This model provides an open, unified framework that supports a variety of expert systems and integrates them with existing computer-integrated manufacturing (CIM) packages. The models provide a single consistent representation of the manufacturing domain that is shared by all applications. The shells embody methodologies, algorithms, and knowledge representations that are task-specific, but largely independent of the domain. Customized with domain-specific expertise, the shells will work for any environment that can be modeled
Keywords :
CAD/CAM; expert systems; manufacturing computer control; manufacturing data processing; CIM; application-specific shells; control; diagnosis; domain-specific expertise; expert systems; knowledge-based computer-integrated manufacturing; manufacturing domain; manufacturing environment; manufacturing personnel; monitoring; object-oriented tools; scheduling; semiconductor fabrication line; simulation; Computer integrated manufacturing; Job shop scheduling; Knowledge based systems; Manufacturing processes; Monitoring; Object oriented modeling; Semiconductor device manufacture; Semiconductor device testing; System testing; Virtual manufacturing;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.24927
Filename :
24927
Link To Document :
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