• DocumentCode
    984736
  • Title

    Importance of unraveling memory propagation effects in interpreting data on partial discharge statistics

  • Author

    Van Brunt, R.J. ; Cernyar, E.W. ; von Glahn, P.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    28
  • Issue
    6
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    905
  • Lastpage
    916
  • Abstract
    The significance of memory propagation in controlling the stochastic behavior of partial-discharge phenomena is demonstrated by determination of various conditional amplitude and phase-of-occurrence distributions for both measured and simulated discharge pulses. A system that can be used to measure directly a set of both conditional and unconditional pulse amplitude and phase distributions needed to reveal memory effects and quantify the phase-resolved stochastic properties of partial-discharge pulses, is briefly described. It is argued that not only is an unraveling of memory effects essential in any attempt to understand the physical basis for the observed stochastic behavior of partial-discharge phenomena, but also that the data on conditional distributions provide additional statistical information that may be needed to optimize the reliability of partial-discharge pattern recognition schemes now being considered for use in insulation testing
  • Keywords
    charge measurement; impulse testing; insulation testing; partial discharges; pattern recognition; statistical analysis; stochastic processes; conditional amplitude distribution; data interpretation; insulation testing; memory propagation effects; partial discharge statistics; partial-discharge pattern recognition schemes; phase-of-occurrence distributions; phase-resolved stochastic properties; point-to-electrode gap; pulse amplitude distribution; real time stochastic analyzer; reliability; simulated discharge pulses; Information analysis; Insulation testing; NIST; Partial discharges; Pattern recognition; Phase measurement; Pulse measurements; Statistical distributions; Stochastic processes; Stochastic systems;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.249364
  • Filename
    249364