DocumentCode :
984882
Title :
Effect of sampling jitter on some sine wave measurements
Author :
Wagdy, Mahmound Fawzy ; Awad, Selim S.
Author_Institution :
Dept. of Electr. Eng., California State Univ., Long Beach, CA, USA
Volume :
39
Issue :
1
fYear :
1990
fDate :
2/1/1990 12:00:00 AM
Firstpage :
86
Lastpage :
89
Abstract :
The effect of sampling jitter on some periodic signal measurements, namely, the amplitude and phase of a pure sinusoid, is investigated. The parameters are determined by the fast Fourier transform (FFT) algorithm, which is used for manipulating samples in a data-acquisition system. Results are expressed in terms of mean values and variances of the measured parameters. Computer simulation results, based on Gaussian jitter, show the changes of amplitude and phase standard deviations versus the changes of standard deviation of jitter and signal amplitude for different numbers of FFT points
Keywords :
Fourier analysis; analogue-digital conversion; computerised signal processing; data acquisition; digital simulation; fast Fourier transforms; phase measurement; voltage measurement; FFT algorithm; Gaussian jitter; amplitude; computer simulation; data-acquisition; fast Fourier transform; mean values; periodic signal measurements; phase; sampling jitter; sine wave measurements; standard deviations; variances; Apertures; Computer simulation; Discrete Fourier transforms; Jitter; Phase measurement; Random variables; Sampling methods; Signal processing algorithms; Statistics; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.50422
Filename :
50422
Link To Document :
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