• DocumentCode
    985068
  • Title

    The effect of conductivity losses on propagation through the helical slow-wave structure of a traveling-wave tube

  • Author

    Jain, P.K. ; Basu, B.N.

  • Author_Institution
    Dept. of Electron. Eng., Banaras Hindu Univ., Varanasi, India
  • Volume
    35
  • Issue
    4
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    549
  • Lastpage
    558
  • Abstract
    A general theory has been developed to account for the material conductivity losses on the performance characteristics of a helical slow-wave structure (SWS) traveling-wave tube (TWT). The effects of helix/envelope conductivity have been studied on various propagation parameters, namely, the axial propagation constant, the interaction impedance, the attenuation constant, and the equivalent circuit resistance per unit length of the structure. While with the first two of these parameters, these effects are found to be only of the second order, they are quite significant for the remaining two. The functional dependence of the propagation parameters on the other structure parameters of importance namely, the relative permittivity of the helix supports, the envelope-to-helix separation, the helix pitch angle, and the thickness of the helix wire, has also been shown. The generalized theory developed here has been further tested by comparing the results with those obtained elsewhere for some special cases
  • Keywords
    equivalent circuits; travelling-wave-tubes; attenuation constant; axial propagation constant; conductivity losses; equivalent circuit resistance; helical slow-wave structure; helix pitch angle; interaction impedance; performance characteristics; propagation parameters; relative permittivity; special cases; traveling-wave tube; Attenuation; Conducting materials; Conductivity; Equivalent circuits; Impedance; Performance loss; Permittivity; Propagation constant; Propagation losses; Wire;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.2494
  • Filename
    2494