DocumentCode
985262
Title
High-Power EMI on RF Amplifier and Digital Modulation Schemes
Author
Bayram, Yakup ; Volakis, John L. ; Myoung, Suk Keun ; Doo, Seok Joo ; Roblin, Patrick
Author_Institution
ElectroScience Lab., Ohio State Univ., Columbus, OH
Volume
50
Issue
4
fYear
2008
Firstpage
849
Lastpage
860
Abstract
We present the performance of an RF amplifier and digital modulation techniques in the presence of high-power electromagnetic interference (EMI) to provide existing and next generation communication systems with critical information. An advanced measurement setup comprised of a large-signal network analyzer is used to characterize the adverse effects of EMI on the device characteristics of an RF power amplifier and the performance of digital modulation schemes. Furthermore, our analysis incorporated hybrid numerical tools, such as the hybrid S-parameter method to carry out an extensive EMI analysis of digital modulation schemes in the presence of complex structures, such as cylindrical cavities. Our studies yield critical information for the communication systems. For instance, our analysis suggests that digital modulation schemes are more susceptible to EMI than the RF power amplifier that processes the modulated signals. Power levels of the order of megawatts are required to have a notable impact on the device characteristics of an RF amplifier in the presence of a missile-like body, whereas, much lower power levels are sufficient to degrade the performance of a digital modulation scheme as long as it is within the bandwidth of the modulated signal. Our analysis further indicates that nonconstant envelope digital modulation schemes are more susceptible to EMI.
Keywords
S-parameters; electromagnetic interference; modulation; network analysers; power amplifiers; radiofrequency amplifiers; RF power amplifier; digital modulation; high-power EMI; high-power electromagnetic interference; hybrid S-parameter; large-signal network analyzer; missile-like body; modulated signals; next generation communication systems; Digital modulation; Electromagnetic interference; Electromagnetic measurements; Performance analysis; Power amplifiers; Power measurement; RF signals; Radio frequency; Radiofrequency amplifiers; Scattering parameters; Digital modulation; electromagnetic interference (EMI); intentional EMI; power amplifier;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2008.2004600
Filename
4670487
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