DocumentCode
985393
Title
High-tolerance three-Josephson-junction curent-injection logic devices (HTCID)
Author
Beha, Hansjörg ; Jäckel, Heinz
Author_Institution
IBM Zurich Research Laboratory, Rüschlikon, Switzerland
Volume
17
Issue
6
fYear
1981
fDate
11/1/1981 12:00:00 AM
Firstpage
3423
Lastpage
3425
Abstract
A new 3-Josephson-junction interferometer is presented as a high-tolerance nonlinear current-injection 2-input AND gate. In Josephson LSI circuits, the tolerances are an important issue. Thus, in our new logic device emphasis has been placed on its static and dynamic tolerance properties. The new HTCID offers considerably better input-signal tolerances than known 2-junction current-injection devices (CID) for identical fabrication tolerance assumptions. The HTCID in this example has a Josephson current ratio of 1:3:1 and a characteristic phase λ = 0.72π. Including circuit parameter variations, this new 3-junction CID allows attractive, high input-signal tolerances of ± 33.3%. Therefore, an almost threefold tolerance improvement over the published 2-junction CID (λ = 0.66π) could be achieved. Trade-off between signal tolerances and device speed is discussed. Computer simulation indicates a worst-case delay of less than 47 ps.
Keywords
Josephson device logic gates; Circuit stability; Delay effects; Equations; Josephson effect; Logic devices; Statistical analysis; Switches; Switching circuits; Threshold voltage; Tolerance analysis;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1061582
Filename
1061582
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