DocumentCode
985455
Title
Threshold characteristics of Josephson interferometers
Author
Imamura, T. ; Hasuo, S. ; Yamaoka, T.
Author_Institution
Fujitsu Laboratories Ltd., Kawasaki, Japan
Volume
17
Issue
6
fYear
1981
fDate
11/1/1981 12:00:00 AM
Firstpage
3429
Lastpage
3431
Abstract
Interferometers with two and three Josephson junctions were fabricated and their threshold characteristics were measured for various device dimensions. Experimental results are compared with calculated results including thin film and fringing effects, and good agreement is obtained.
Keywords
Josephson devices; Counting circuits; Electrodes; Equivalent circuits; Inductance; Interferometers; Josephson junctions; Magnetic fields; Niobium compounds; Thin film circuits; Tunneling;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1061588
Filename
1061588
Link To Document