• DocumentCode
    9855
  • Title

    Ameliorating Thermally Accelerated Aging With State-Based Application of Fault-Tolerance in Cyber-Physical Computers

  • Author

    Krishna, C. Mani

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
  • Volume
    64
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    4
  • Lastpage
    14
  • Abstract
    Cyber-physical systems have become more prevalent in recent years. Computer control is increasingly being considered for use in applications which are operationally resource-constrained and are very cost-sensitive, while requiring very high reliability. The primary approach to building ultra-reliable systems is to deploy massive redundancy. However, the constraints just mentioned make it very difficult to use the massive everywhere-redundancy approaches used in such traditional (relatively cost-insensitive) applications as aerospace. In this paper, we address such problems by adaptively adjusting fault-tolerance levels according to the current state of the controlled plant. Such an approach imposes far less thermal stress on the computer, thereby enhancing reliability, and thus requiring a smaller number of line-replaceable units to maintain required levels of reliability over any given period of operation.
  • Keywords
    control engineering computing; fault tolerant computing; adaptive fault-tolerance level adjustment; aerospace; computer control; computer thermal stress; cost-sensitive operation; cyber-physical computers; cyber-physical systems; line-replaceable units; massive everywhere-redundancy approach; reliability level; resource-constrained operation; state-based application; thermally accelerated aging amelioration; Aerospace electronics; Computers; Fault tolerance; Fault tolerant systems; Noise; Satellites; Adaptive fault-tolerance; computer control; cyber-physical systems; thermal processor management; thermally accelerated aging;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2014.2363154
  • Filename
    6935040