Title :
Control of locally testable duplex system for large-scale implementation
Author :
Lombardi, Floriana
Author_Institution :
Texas Technical University, Department of Electrical Engineering/Computer Science, Lubbock, USA
Abstract :
In the letter the control of a duplex system is presented. This is characterised by the locality of the testing devices and by easy expandability to a larger system with large-scale attributes. The control suggests the viability of a VLSI chip implementation by a modular design.
Keywords :
computer architecture; computer testing; fault tolerant computing; large scale integration; VLSI chip implementation; complete architecture; computer testing; duplex system; fault tolerant systems; local testing; modular design; system control;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830271
