Domain pattern measurements using CCD

In the domain observation apparatus using Kerr effect, it is absolutely necessary to do troublesome surface polishings in order to get good contrast. So, it is almost impossible to observe many samples quickly. We have developed a new domain pattern observation apparatus, in which the reflected lights by Kerr effect are converted into electric signals by CCD image sensor and the electric signals are processed by micro-computer to enhance the contrast. Using this appararus, the domain patterns of amorphous magnetic materials have been observed without any surface polishing.