Title : 
Reliability Bounds for Multi-State 
 
 -out-of-
 
  Systems
 
         
        
            Author : 
Tian, Zhigang ; Yam, Richard C M ; Zuo, Ming J. ; Huang, Hong-Zhong
         
        
            Author_Institution : 
Univ. of Alberta, Edmonton
         
        
        
        
        
            fDate : 
3/1/2008 12:00:00 AM
         
        
        
        
            Abstract : 
Algorithms have been available for exact performance evaluation of multi-state k-out-of-n systems. However, especially for complex systems with a large number of components, and a large number of possible states, obtaining "reliability bounds" would be an interesting, significant issue. Reliability bounds will give us a range of the system reliability in a much shorter computation time, which allow us to make decisions more efficiently. The systems under consideration are multi-state k-out-of-n systems with i.i.d. components. We will focus on the probability of the system in states below a certain state d, denoted by Qsd. Based on the recursive algorithm proposed by Zuo & Tian [14] for performance evaluation of multi-state k-out-of-n systems with i.i.d. components, a reliability bounding approach is developed in this paper. The upper, and lower bounds of Qsd are calculated by reducing the length of the k vector when using the recursive algorithm. Using the bounding approach, we can obtain a good estimate of the exact Qsd value while significantly reducing the computation time. This approach is attractive, especially to complex systems with a large number of components, and a large number of possible states. A numerical example is used to illustrate the significance of the proposed bounding approach.
         
        
            Keywords : 
performance evaluation; probability; reliability theory; complex systems; multi state k out of n systems; performance evaluation; probability; system reliability;  $k$-out-of-$n$  systems; Bound; multi-state; recursive algorithm;
         
        
        
            Journal_Title : 
Reliability, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TR.2007.909766