• DocumentCode
    985856
  • Title

    A self-aligned lateral bipolar transistor realized on SIMOX-material

  • Author

    Edholm, B. ; Olsson, Jörgen ; Söderbärg, Anders

  • Author_Institution
    Dept. of Technol., Uppsala Univ., Sweden
  • Volume
    40
  • Issue
    12
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    2359
  • Lastpage
    2360
  • Abstract
    Lateral bipolar transistors, compatible with a CMOS process on SOI, have been fabricated on high quality SIMOX material. A self-aligned nitride spacer technique is used for base width definition and for emitter alignment. Current gains of 40 and high collector-emitter breakdown voltages have been obtained for transistors with base widths of 4000 Å
  • Keywords
    BiCMOS integrated circuits; SIMOX; bipolar transistors; 4000 angstrom; BiCMOS integration; CMOS process compatibility; SIMOX material; Si-Si3N4-SiO2; base width; base width definition; current gain; emitter alignment; high collector-emitter breakdown voltages; self-aligned lateral bipolar transistor; self-aligned nitride spacer; BiCMOS integrated circuits; Bipolar transistors; CMOS process; CMOS technology; Integrated circuit technology; Manufacturing; Process control; Robust control; Semiconductor films; Silicon on insulator technology;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.249487
  • Filename
    249487