DocumentCode :
985895
Title :
Origin of the difference between the capacitance intercept voltage and the built-in potential
Author :
Mieghem, P. Van
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume :
40
Issue :
12
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
2365
Lastpage :
2368
Abstract :
For a diode with an abrupt, constant doping profile, the difference between the built-in potential Vbi and capacitance intercept voltage Vint is shown to be at least 2(kBT/q). The difference lies in the fact that q×Vint is related to the work needed to create this space charge
Keywords :
capacitance; electric potential; p-n homojunctions; semiconductor diodes; space charge; abrupt constant doping profile; built-in potential; capacitance intercept voltage; electrostatic potential difference; n-p diode structure; p-n junction; space charge; Capacitance measurement; Doping profiles; Electrostatics; Equations; Photonic band gap; Potential energy; Semiconductor devices; Semiconductor diodes; Space charge; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.249490
Filename :
249490
Link To Document :
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