DocumentCode :
985944
Title :
Substrate testing of film heads
Author :
Anderson, N.C. ; Jones, R.E., Jr.
Author_Institution :
IBM Corporation, Rochester, MN
Volume :
17
Issue :
6
fYear :
1981
fDate :
11/1/1981 12:00:00 AM
Firstpage :
2896
Lastpage :
2898
Abstract :
Testing of film heads while still on the substrate is important in determining those heads suitable for processing through fabrication of air bearings, mounting on suspensions and final testing. A proper interpretation of on-substrate test results is essential. This paper analyzes the relationship between head inductances measured on the substrate and poletip width, magnetic permeabilities, film thicknesses and planar dimensions.
Keywords :
Magnetic recording/reading heads; Circuit faults; Circuit testing; Coils; Inductance; Magnetic analysis; Magnetic circuits; Magnetic films; Magnetic heads; Permeability; Substrates;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1061629
Filename :
1061629
Link To Document :
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