DocumentCode
985987
Title
Annealing effects on FMR linewidth in Ga substituted YIG
Author
Roschmann, P.
Author_Institution
Philips GmbH Forschungslaboratorium Hamburg, Hamburg, Germany
Volume
17
Issue
6
fYear
1981
fDate
11/1/1981 12:00:00 AM
Firstpage
2973
Lastpage
2975
Abstract
Results of the FMR linewidth versus frequency and temperature and of the parallel pump spinwave linewidth are reported for YIG and Ga:YIG single crystal spheres subjected to different thermal treatments in O2 , N2 and H2 /N2 ambients. The slopes of the frequency dependent part of the FMR linewidth are found to be proportional to the respective measured spinwave linewidth, w hence either of these quantities represents the intrinsic FMR losses of the bulk material. The observed frequency independent park of the linewidth is assumed to represent two-magnon scattering contributions due to surface and crystal imperfections. This contribution has been further separated into two parts which depend on the anisotropy field and the saturation magnetization, respectively. The intrinsic FMR losses and the two-magnon scattering contribution are characteristically influenced by changes in the cation distribution, saturation magnetization, anisotropy field and oxygen vacancy concentration induced in the samples by the various thermal treatments.
Keywords
Magnetic resonance; Magnetic thermal factors; YIG materials/devices; Anisotropic magnetoresistance; Annealing; Crystalline materials; Frequency dependence; Frequency measurement; Loss measurement; Magnetic resonance; Saturation magnetization; Scattering; Temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1061632
Filename
1061632
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