• DocumentCode
    985987
  • Title

    Annealing effects on FMR linewidth in Ga substituted YIG

  • Author

    Roschmann, P.

  • Author_Institution
    Philips GmbH Forschungslaboratorium Hamburg, Hamburg, Germany
  • Volume
    17
  • Issue
    6
  • fYear
    1981
  • fDate
    11/1/1981 12:00:00 AM
  • Firstpage
    2973
  • Lastpage
    2975
  • Abstract
    Results of the FMR linewidth versus frequency and temperature and of the parallel pump spinwave linewidth are reported for YIG and Ga:YIG single crystal spheres subjected to different thermal treatments in O2, N2and H2/N2ambients. The slopes of the frequency dependent part of the FMR linewidth are found to be proportional to the respective measured spinwave linewidth, w hence either of these quantities represents the intrinsic FMR losses of the bulk material. The observed frequency independent park of the linewidth is assumed to represent two-magnon scattering contributions due to surface and crystal imperfections. This contribution has been further separated into two parts which depend on the anisotropy field and the saturation magnetization, respectively. The intrinsic FMR losses and the two-magnon scattering contribution are characteristically influenced by changes in the cation distribution, saturation magnetization, anisotropy field and oxygen vacancy concentration induced in the samples by the various thermal treatments.
  • Keywords
    Magnetic resonance; Magnetic thermal factors; YIG materials/devices; Anisotropic magnetoresistance; Annealing; Crystalline materials; Frequency dependence; Frequency measurement; Loss measurement; Magnetic resonance; Saturation magnetization; Scattering; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1061632
  • Filename
    1061632