• DocumentCode
    985997
  • Title

    Effect of media properties on side erase bands

  • Author

    Lin, Kate Ching-Ju ; Thomas, Gael

  • Author_Institution
    Dept. of Mater. Sci. & Miner. Eng., California Univ., Berkeley, CA
  • Volume
    26
  • Issue
    1
  • fYear
    1990
  • fDate
    1/1/1990 12:00:00 AM
  • Firstpage
    132
  • Lastpage
    134
  • Abstract
    The erase bands on CoNiCr/Cr longitudinal media with coercivities ranging from 176 to 1390 Oe have been studied using a two-frequency, triple-track profile method. In this method, the two side tracks are recorded at 10 kfci and the central track ranges from 0 to 40 kfci. The write and the erase widths are measured by the Bitter method. Media properties such as coercivity, coercivity squareness, and remanence-thickness product are correlated with the total write width. It is shown that media with high coercivity squareness contribute to a reduction in the width of a side erase band. The magnetic structure of the triple-track profile has been characterized by high-resolution Bitter patterns using scanning electron microscopy, showing domain structures within bit cells and along track edges. The relationship of the erase band to the magnetic structure is discussed
  • Keywords
    chromium; chromium alloys; cobalt alloys; coercive force; magnetic domains; magnetic recording; nickel alloys; remanence; scanning electron microscope examination of materials; Bitter method; CoNiCr-Cr longitudinal media; bit cells; coercivities; coercivity squareness; domain structures; erase widths; high-resolution Bitter patterns; magnetic structure; remanence-thickness product; scanning electron microscopy; side erase bands; track edges; two frequency triple-track profile method; write width; Chromium; Coercive force; Disk recording; Frequency; Magnetic domains; Magnetic heads; Magnetic properties; Magnetic recording; Materials science and technology; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.50511
  • Filename
    50511