Title :
Reconfigurable readback-signal generator based on a field-programmable gate array
Author :
Chen, Jinghuan ; Moon, Jaekyun ; Bazargan, Kia
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
fDate :
5/1/2004 12:00:00 AM
Abstract :
We have designed a readback-signal generator to provide noise-corrupted signals to a read channel simulator. It is implemented in a Xilinx Virtex-E field-programmable gate array (FPGA) device. The generator simulates in hardware the noise processes and distortions observed in hard drives. It uses embedded nonuniform random number generators to simulate the random characteristics of various disturbances in the read/write process. The signal generator can simulate readback pulses, intersymbol interference, transition noise, electronics noise, head and media nonlinearity, intertrack interference, and write timing error according to the characteristics specified by the user. A sample implementation operates at a 70-MHz clock speed. The design can easily be scaled for different error rates. The generator can be reconfigured in real time to give the user flexibility and increase the capacity of the FPGA device. The readback-signal generator can be integrated into an FPGA read channel simulator or serve as a test bench for data-recovery circuits.
Keywords :
field programmable gate arrays; random number generation; reconfigurable architectures; signal generators; 70 MHz; FPGA device; Gaussian pseudorandom number generator; Xilinx Virtex-E; data-recovery circuits; electronics noise; embedded random number generators; field-programmable gate array; hard drives; head nonlinearity; intersymbol interference; intertrack interference; magnetic recording; media nonlinearity; noise processes; noise-corrupted signals; nonuniform random number generators; read channel modeling; read channel simulator; read-write process; readback pulses; real time configuration; reconfigurable computing; reconfigurable readback-signal generator; test bench; transition noise; user flexibility; write timing error; Circuit testing; Drives; Field programmable gate arrays; Hardware; Intersymbol interference; Noise generators; Random number generation; Signal design; Signal generators; Timing; FPGA; Field programmable gate array; Gaussian pseudorandom number generator; magnetic recording; read channel; read channel modeling; reconfigurable computing; transition noise;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.826913