Selecting the most reliable design under type-II censored accelerated testing

Author

Chang, Dong-Shang ; Huang, Deng-Yuan ; Tseng, Sheng-Tsaing

Author_Institution

Dept. of Bus. Adm., Nat. Central Univ., Chung-Li, Taiwan

Volume

41

Issue

4

fYear

1992

fDate

12/1/1992 12:00:00 AM

Firstpage

588

Lastpage

592

Abstract

Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-II censoring plan, a reasonable selection rule for an ALT using the Arrhenius model is proposed. The advantages of this selection rule are compared with a nonALT selection rule by using as criteria the average ratio of time-saving in life testing and sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible

Keywords

failure analysis; life testing; reliability; Arrhenius model; accelerated testing; design; failure analysis; life tests; reliability; sample size; type-II censoring plan; Life estimation; Life testing; Materials reliability; Materials testing; Maximum likelihood estimation; Reliability engineering; Reliability theory; Statistical analysis; Stress; Temperature;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.249592

Filename

249592